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倒立共軛焦暨超高解析度顯微鏡

一、倒立共軛焦暨超高解析度顯微鏡

儀器名稱：

Zeiss LSM 780 plus ELYRA S.1

 

儀器功能：

  • Multiple confocal fluorescence image acquisition
  • Spectrum unmixing
  • 3D image acquisition & processing
  • Timelapse image acquisition (not for multiwell plates!)
  • Photo bleach experiment (FRAP, FLIP)
  • FRET experiment
  • Analysis: space, intensity, histogram, profile, colocalization.
  • SIM (Structured Illumination Microscopy) super resolution imaging
  • AiryScan imaging

儀器配備：


Items

Specification

SoftwareZEN 2.1
VisArt module
StitchArt module
HDR module
MTS module
AiryScan module
 
MicroscopeStandMotorized inverted microscope
XY Scanning Stage
Z Piezo Insert
ObjectiveEC Plan-Neofluar 10x/0.3 Ph1
Plan-Apochromat 10x/0.45
LD Plan-Neofluar 20x/0.4 Ph2
Plan-Apochromat 20x/0.8
LD LCI Plan-Apochromat 25x/0.8 Imm.
LD Plan-Neofluar 40x/0.6 Ph2
Plan-Apochromat 40x/0.95
LD C-Apochromat 40x/1.1 W
C-Apochromat 40x/1.2 W
Plan-Apochromat 40x/1.3 Oil
Plan-Apochromat 40x/1.4 Oil
C-Apochromat 63x/1.2 W
Plan-Apochromat 63x/1.4 Oil
Plan-Apochromat 100x/1.4 Oil
alpha Plan-Apochromat 100x/1.46 Oil
Fl. Light sourceX-cite 120
Fl. FilterDAPI--- Ex: G365, BS: 395, Em: BP 445/50
EGFP--- Ex: BP 470/40, BS: 495, Em: BP 525/50
Cy3--- Ex: BP 545/25, BS: 570, Em: BP 605/70
CFP--- Ex: BP 436/20, BS: 455, Em: BP 480/40
YFP--- Ex: BP 520/20, BS: 515, Em: BP 535/30
 
Culture system-
ConfocalLaser DeviceDiode 405 nm (30 mW)
Diode 440 nm CW/PS (25mW)
Argon 458,488,514 nm (25 mW)
DPSS 561 nm (20 mW)
HeNe 594nm (2mW)
HeNe 633 nm (5 mW)
DetectorConventional PMT Fl. detector (x2)
Spectrum GaAsP detector (x1)
Transmitted detector (x1)
AiryScan detector (x1)
 
Super ResolutionLaser DeviceDiode 405 nm (50 mW)
Diode 488 nm (100 mW)
DPSS 561 nm (100 mW)
Diode 642 nm (100 mW)
Fl. FilterDAPI--- BS: 405, Em: BP 420-480/LP 750
EGFP--- BS: -488, Em: BP 495-550/LP 750
Cy3--- BS: -561, Em: BP 570-620/LP 750
Cy5--- BS: -642, Em: LP 655
GOR--- Ex: 483/564/642, BS: 506/582/659, Em: 526/601/688
DetectorEMCCD--- Andor iXon 885, 1004x1002